Memory Solution

Managing yield for today’s giga-scale DRAM, SRAM and FLASH memory devices is a complex activity. Huge volumes of test and fabrication data from multiple sources must be gathered, correlated and analyzed with a short turnaround time. Out of spec conditions must be flagged and reported automatically when discovered. For interactive analysis, the raw data and automated analysis results must be presented in a clear, concise graphical display to enable rapid root cause identification. Synopsys’ Memory YieldDirector™ provides the perfect solution for this multi-faceted task.

Memory YieldDirector (MYD) accelerates yield learning and root cause analysis for DRAM, SRAM and FLASH memories. MYD analysis algorithms automatically classify failing bitmaps into unique signatures, and correlate them to in-line defect inspection data for comprehensive defect to bitmap analysis. Combining powerful bitmap classification capabilities and high volume data importation with advanced, intuitive graphical analysis, MYD empowers memory engineers to quickly identify yield-limiting issues and maximize yield.

Features Summary:

• Failed bits signature editor
• Unique, platform-independent failed bits signature search engine with signature clustering, rotation and mirroring abilities for wafer and die level analysis
• Integrated wafer and die visualization for defects, bitmaps, images and failed bit signatures - all in one application
• Complex wafer and die composite maps, with context-sensitive interactive charts
• Stage navigation option, synchronized by data source and chip layout
• Fully extensible functionality with Workflows, allowing user-defined analyses launched from any MYD client station
• Integrates with StatTool advanced statistical analysis and data mining tools
• Easy-to-configure, platform-independent data importation and off-line report generation with Workflows

Benefits Summary:

• Maximizes yields with rapid isolation of root cause failures
• Reduces costs due to faster problem identification
• Enables quicker time-to-productivity by rapid deployment of custom functionality

Integrated Wafer, Die and Chart Views in MYD

Easy Customization using Workflow Data Processor